Margin calibration method and margin calibration system for static timing analysis
AssigneeRealtek Semiconductor Corp.
InventorsYing-Chieh Chen, Mei-Li Yu, Yu-Lan Lo
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AssigneeRealtek Semiconductor Corp.
InventorsYing-Chieh Chen, Mei-Li Yu, Yu-Lan Lo
Estimating the term…
A margin correction method and a margin correction system for static timing analysis are provided. The margin calibration method includes: measuring dies on a to-be-tested chip with a target circuit to obtain performance data records; obtaining simulation data records for simulating performances of the dies; executing a static timing analysis (STA) tool to obtain timing analysis results; statistically calculating a simulation process corner based on the timing analysis results; obtaining a measurement process corner based on the performance data records; establishing a statistical model that defines a margin as a difference between the measurement process corner and the simulation process corner; substituting the timing analysis results and the measurement process corner into the statistical model and execute a model fitting algorithm, for fitting the statistical model to a target model to obtain the margin; and obtaining calibrated timing analysis results.
A margin calibration method for static timing analysis, the margin calibration method comprising:
A margin calibration system for static timing analysis, the margin calibration system comprising:
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