Block stripe building for a memory device

An apparatus, comprising:

• processing circuitry associated with one or more memory devices and configured to cause the apparatus to:
• generate a plurality of block stripe sets for a memory device in accordance with a plurality of skew offset values, wherein each block stripe set of the plurality of block stripe sets corresponds to a respective skew offset value of the plurality of skew offset values, and wherein each block stripe of a respective block stripe set comprises a respective subset of memory blocks from each memory die of a plurality of memory dies associated with the memory device;
• determine, for each block stripe of each block stripe set of the plurality of block stripe sets, a respective quantity of memory dies that are associated with the block stripe and satisfy a threshold quantity of bad blocks;
• disqualify a respective quantity of block stripes within each block stripe set of the plurality of block stripe sets based at least in part on the respective quantities of memory dies;
• select a skew offset value from among the plurality of skew offset values based at least in part on the respective quantity of disqualified block stripes within each block stripe set of the plurality of block stripe sets;
• and
• configure the memory device to perform access operations in accordance with a block stripe set of the plurality of block stripe sets, the block stripe set corresponding to the selected skew offset value.

A non-transitory computer-readable medium storing code, the code comprising instructions executable by one or more processors to:

• generate a plurality of block stripe sets for a memory device in accordance with a plurality of skew offset values, wherein each block stripe set of the plurality of block stripe sets corresponds to a respective skew offset value of the plurality of skew offset values, and wherein each block stripe of a respective block stripe set comprises a respective subset of memory blocks from each memory die of a plurality of memory dies associated with the memory device;
• determine, for each block stripe of each block stripe set of the plurality of block stripe sets, a respective quantity of memory dies that are associated with the block stripe and satisfy a threshold quantity of bad blocks;
• disqualify a respective quantity of block stripes within each block stripe set of the plurality of block stripe sets based at least in part on the respective quantities of memory dies;
• select a skew offset value from among the plurality of skew offset values based at least in part on the respective quantity of disqualified block stripes within each block stripe set of the plurality of block stripe sets;
• and
• configure the memory device to perform access operations in accordance with a block stripe set of the plurality of block stripe sets, the block stripe set corresponding to the selected skew offset value.