Method for analyzing a demodulated measurement signal, computer-readable storage medium, and test instrument
AssigneeRohde & Schwarz GmbH & Co. KG
InventorsPB Balasubramanium, Martin Schmaehling, Annika Germer
Life of this patent
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Abstract
A method for analyzing a demodulated measurement signal is described. The method includes, for example, the following steps: obtaining a demodulated measurement signal; deriving a processed signal from the demodulated measurement signal; applying a trigger mask to the processed signal; and evaluating if the processed signal creates a trigger event with respect to the trigger mask.
Claims19
A method for analyzing a demodulated measurement signal in a test instrument, the method comprising:
- obtaining a demodulated measurement signal from a modulated signal received at a signal input of the test instrument;
- deriving a processed signal from the demodulated measurement signal, wherein the deriving comprises determining a frequency response of an equalizer function by calculating an error vector magnitude for the demodulated measurement signal with respect to a reference signal;
- applying a trigger mask to the processed signal;
- determining that the processed signal creates a trigger event with respect to the trigger mask;
- and
- responsive to determining that the processed signal creates the trigger event with respect to the trigger mask, triggering a data acquisition including transferring signal data from a data buffer to memory, wherein applying the trigger mask reduces a risk of missing distortion events in the processed signal.
A non-transitory computer-readable storage medium comprising instructions which, when executed by an electronic circuit of a test instrument, cause the electronic circuit to perform the steps of:
- obtaining a demodulated measurement signal from a modulated signal received at a signal input of the test instrument;
- deriving a processed signal from the demodulated measurement signal, wherein the deriving comprises determining a frequency response of an equalizer function by calculating an error vector magnitude for the demodulated measurement signal with respect to a reference signal;
- applying a trigger mask to the processed signal;
- determining that the processed signal creates a trigger event with respect to the trigger mask;
- and
- responsive to determining that the processed signal creates the trigger event with respect to the trigger mask, triggering a data acquisition including transferring signal data from a data buffer to memory, wherein applying the trigger mask reduces a risk of missing distortion events in the processed signal.
A test instrument comprising circuitry configured to:
- obtain a demodulated measurement signal from a modulated signal received at a signal input of the test instrument,
- derive a processed signal from the demodulated measurement signal, wherein deriving the processed signal comprises determining a frequency response of an equalizer function by calculating an error vector magnitude for the demodulated measurement signal with respect to a reference signal;
- apply a trigger mask to the processed signal;
- determine that the processed signal creates a trigger event with respect to the trigger mask;
- and
- responsive to determining that the processed signal creates the trigger event with respect to the trigger mask, trigger a data acquisition including transferring signal data from a data buffer to memory, wherein applying the trigger mask reduces a risk of missing distortion events in the processed signal.
Dependencies are inferred from the claim text.