Electrical voltage measuring device using an microelectromechanical system and optical interferometer interaction

An electrical voltage measuring device, comprising:

• at least one microelectromechanical device comprising a first electrode configured to be connected to an anode of an electrical voltage source and a second electrode configured to be connected to a cathode of said electrical voltage source such the first electrode is configured to be movable and the second electrode is configured to be non-movable, wherein the microelectromechanical device is configured to receive an electrical voltage from the electrical voltage source causing a displacement of the first electrode associated with said electrical voltage, wherein said displacement causes a variation of distance between the first electrode and the second electrode;
• and
• an optical processor comprising a laser and an optical sensor, the optical processor configured to:
• project, using the laser, a light beam through a laser light injection point on the first electrode such that the light beam is projected onto an inner surface of the first electrode between the first electrode and the second electrode;
• detect with the optical sensor reflections of the light beam, wherein a distance variation between the first electrode and the laser light injection point generates a variation of at least one reflection of the light beam;
• obtain interference patterns based on the light beam and the at least one reflection of the light beam;
• and
• calculate a value of the electrical voltage applied to the first electrode and the second electrode based on the interference patterns.