Characterizing optical structures based on optical circuits with different structural features
AssigneeCiena Corporation
InventorsAlexandre D. Simard, Martin Caron, Marie-Josee Picard, Keven Bedard
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AssigneeCiena Corporation
InventorsAlexandre D. Simard, Martin Caron, Marie-Josee Picard, Keven Bedard
Estimating the term…
In one aspect, in general, a method comprises: providing optical waves to each of N optical circuits, each optical circuit comprising one or more of each of p structural features, where p is an integer greater than 1, and N is greater than or equal to p+1; measuring optical responses from each of the optical circuits, where each measured optical response depends at least in part on the optical wave provided to the respective optical circuit; and computing an optical loss associated with each of the p structural features based at least in part on an optical loss for each optical circuit that is calculated based at least in part on the optical wave provided to and the measured optical response from a respective optical circuit, and quantities of each of the p structural features in each of the respective optical circuits.
A method comprising:
An article of manufacture comprising:
Dependencies are inferred from the claim text.