Stress-resistant trace structure and piezoelectric detection device made thereof
AssigneesInterface Technology (ChengDu) Co., Ltd., Interface Optoelectronics (Shenzhen) Co., Ltd., General Interface Solution Limited
InventorsBo-Jhang Sun, Chih-Chin Ko, Hsin-Yu Chen, Ji-An Chen
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Abstract
Disclosed is a stress-resistant trace structure and a piezoelectric detection device made thereof. The stress-resistant trace structure includes a patterned trace layer and a porous anti-stress layer. The patterned trace layer has a non-linear pattern and is configured on the porous anti-stress layer. Specifically, the porous anti-stress layer has a plurality of through holes, and the through holes are vertically interlaced with the non-linear pattern.
Claims11
A stress-resistant trace structure comprising:
- a porous anti-stress layer having a plurality of through holes;
- a patterned trace layer having a non-linear pattern and being configured on the porous anti-stress layer, wherein the through holes of the porous anti-stress layer are vertically interlaced with the non-linear pattern of the patterned trace layer.
Dependencies are inferred from the claim text.