Semiconductor device based on dielectric material containing metal interstitial impurity
AssigneeInstitute of Microelectronics, Chinese Academy of Sciences
InventorsQing Luo, Yuan Wang, Ming Liu
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AssigneeInstitute of Microelectronics, Chinese Academy of Sciences
InventorsQing Luo, Yuan Wang, Ming Liu
Estimating the term…
The present disclosure provides a semiconductor device based on a dielectric material containing a metal interstitial impurity, including: a substrate, a dielectric material layer, and a functional layer. A material for preparing the dielectric material layer is a compound containing the metal interstitial impurity. The dielectric material layer and/or the functional layer is configured to subject to at least one of electricity, heat, light or magnetism, such that the dielectric material layer reaches a crystallization temperature to transit from a first state to a second state.
A semiconductor device based on a dielectric material containing a metal interstitial impurity, comprising:
Dependencies are inferred from the claim text.