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US 12,761,052 B2Granted
Sensing system, sensing method, and analyzer
AssigneeNTT, Inc.
InventorsTatsuya Okamoto, Daisuke Iida, Yusuke Koshikiya, Nazuki Honda
Life of this patent
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AssigneeNTT, Inc.
InventorsTatsuya Okamoto, Daisuke Iida, Yusuke Koshikiya, Nazuki Honda
Estimating the term…
An object of the present invention is to provide a sensing system, a sensing method, and an analyzing device using OFDR in which a sensing range of strain/temperature is less likely to be limited by a frequency sweep width. In the sensing method using OFDR, the sensing system according to the present invention employs sequential update, per measurement by one frequency sweep of the probe light, for setting the reference spectrum to the spectrum of an immediately preceding measurement, by which a spectral shift between an n-th measurement and an (n−1)th measurement is obtained, and the spectral shifts individually obtained between the measurements are integrated.
A sensing system that includes a measuring device and an analyzing device, wherein
A sensing method comprising:
An analyzing device for analyzing spectrum obtained in measurement which a measuring device inputs a probe light whose frequency is swept once over a frequency sweep width ΔF into an optical fiber, and repeatedly performs measurement using Optical Frequency Domain Reflectometry (OFDR) for acquiring the spectrum of a backscattered light, the analyzing device configured to:
Dependencies are inferred from the claim text.