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US 12,753,491 B2Granted
Filling method and film forming apparatus
AssigneeTokyo Electron Limited
InventorsToshio Hasegawa, Katsutoshi Ishii
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Abstract
A filling method according to one aspect of the present disclosure is a method of filling a recess formed in a surface of a substrate with a metal oxide film. The method includes forming the metal oxide film by supplying a metallic raw material gas and an oxidant to the recess, and etching a part of the metal oxide film by supplying an etching gas including at least one selected from a group including SOCl2 and (COCl)2 to the metal oxide film.
Claims12
A method of filling a recess formed in a surface of a substrate with a metal oxide film, the method comprising:
- loading the substrate into a processing container;
- forming the metal oxide film by supplying a metallic raw material gas and an oxidant to the recess;
- and
- etching a part of the metal oxide film by supplying an etching gas including at least one selected from a group of SOCl2 and (COCl)2 to the metal oxide film,
- wherein, in the forming and the etching, the substrate is heated to 500 degrees C. or higher,
- wherein the metal oxide film is at least one selected from a group of aluminum oxide film, hafnium oxide film, and zirconium oxide film, and
- wherein, in the etching, the metal oxide film formed on the recess is selectively etched with respect to the metal oxide film formed on an inner wall of the processing container.
4 more elements
Dependencies are inferred from the claim text.