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US 12,750,970 B2Granted
Test system rack with reconfigurable position for system interface
AssigneeNational Instruments Corporation
InventorsKosta Ilic, Michael H. Singerman, Kevin Krietz
Life of this patent
Estimating the term…
Abstract
A test system rack or cabinet includes a housing containing instruments or equipment and a mass interconnect (MIC) mounted within the housing. The MIC has inputs to couple to the instruments or equipment and outputs to couple to a second MIC separate from the rack. The test system rack has legs positioned underneath the housing to support the housing and the first MIC. The test system rack has actuators configured to adjust a position of the first MIC without adjusting a position of the one or more legs.
Claims20
A rack, comprising:
- a housing configured to contain one or more instruments or equipment;
- a first mass interconnect (MIC) mounted within the housing, wherein the first MIC comprises one or more inputs configured to couple to the one or more instruments or equipment and one or more outputs configured to couple to a second MIC separate from the rack;
- one or more legs positioned underneath the housing and configured to support the housing and the first MIC;
- and
- one or more actuators, wherein the one or more actuators are configured to adjust a position of the first MIC without adjusting a position of the one or more legs.
2 more elements
A rack, comprising:
- a housing configured to contain one or more instruments or equipment;
- a first mass interconnect (MIC) mounted within the housing, wherein the first MIC comprises one or more inputs configured to couple to the one or more instruments or equipment and one or more outputs configured to couple to a second MIC separate from the rack;
- and
- one or more actuators, wherein the one or more actuators are configured to adjust a position of the first MIC without adjusting a position of the housing.
1 more element
A method, comprising:
- by one or more actuators, adjusting a first position of a first MIC mounted on a first test system rack, wherein the first MIC comprises one or more inputs configured to couple to the one or more instruments or equipment and one or more outputs configured to couple to a second MIC separate from the first test system rack, wherein the first test system rack comprises a housing configured to contain the one or more instruments or equipment and one or more legs positioned underneath the housing and configured to support the housing and the first MIC,
- wherein adjusting the first position does not adjust a third position of the one or more legs.
Dependencies are inferred from the claim text.