Precision structured-light scanner

A structured-light scanner, comprising:

• a first projector configured to project a first light pattern onto a scanning target, the first light pattern including a first irradiated area where light is irradiated and a first non-irradiated area where light is not irradiated, the first light pattern being irradiated such that the first irradiated area and the first non-irradiated area form elongated bands extending along a first direction;
• a second projector configured to project a second light pattern onto the scanning target, the second light pattern including a second irradiated area where light is irradiated and a second non-irradiated area where light is not irradiated, the second light pattern being irradiated such that the second irradiated area and the second non-irradiated area form elongated bands extending along the first direction and such that a portion of the second irradiated area overlaps a portion of the first irradiated area and a portion of the second non-irradiated area overlaps a portion of the first non-irradiated area on a surface of the scanning target;
• a camera unit configured to capture a shape of the scanning target in a common irradiated area or a common non-irradiated area, the common irradiated area being an area of overlap between the first irradiated area and the second irradiated area and having a width smaller than a width of the first irradiated area and a width of the second irradiated area, the common non-irradiated area being an area of overlap between the first non-irradiated area and the second non-irradiated area and having a width smaller than a width of the first non-irradiated area and a width of the second non-irradiated area;
• and
• a pedestal configured to rotate the first projector and the second projector in relation to the scanning target such that the first light pattern and the second light pattern move along the surface of the scanning target,
• wherein the pedestal comprises a first pedestal and a second pedestal, the first pedestal being configured to rotate the first projector, and the second pedestal being configured to rotate the second projector,
• wherein the camera unit captures the common non-irradiated area, and
• wherein the first pedestal and the second pedestal move the first projector and the second projector such that the first light pattern moves a distance greater than the width of the second irradiated area and smaller than a sum of the widths of the second irradiated area and the second non-irradiated area along a second direction orthogonal to the first direction on the surface of the scanning target before the second light pattern begins to move in a same direction at an equal speed.

A structured-light scanner, comprising:

• a first projector configured to project a first light pattern onto a scanning target, the first light pattern including a first irradiated area where light is irradiated and a first non-irradiated area where light is not irradiated, the first light pattern being irradiated such that the first irradiated area and the first non-irradiated area form elongated bands extending along a first direction;
• a second projector configured to project a second light pattern onto the scanning target, the second light pattern including a second irradiated area where light is irradiated and a second non-irradiated area where light is not irradiated, the second light pattern being irradiated such that the second irradiated area and the second non-irradiated area form elongated bands extending along the first direction and such that a portion of the second irradiated area overlaps a portion of the first irradiated area and a portion of the second non-irradiated area overlaps a portion of the first non-irradiated area on a surface of the scanning target;
• a camera unit configured to capture a shape of the scanning target in a common irradiated area or a common non-irradiated area, the common irradiated area being an area of overlap between the first irradiated area and the second irradiated area and having a width smaller than a width of the first irradiated area and a width of the second irradiated area, the common non-irradiated area being an area of overlap between the first non-irradiated area and the second non-irradiated area and having a width smaller than a width of the first non-irradiated area and a width of the second non-irradiated area;
• and
• a pedestal configured to rotate the first projector and the second projector in relation to the scanning target such that the first light pattern and the second light pattern move along the surface of the scanning target,
• wherein the pedestal comprises a first pedestal and a second pedestal, the first pedestal being configured to rotate the first projector, and the second pedestal being configured to rotate the second projector,
• wherein the camera unit captures the common irradiated area, and
• wherein the first pedestal and the second pedestal move the first projector and the second projector such that the first light pattern moves a distance smaller than the width of the second irradiated area along a second direction orthogonal to the first direction on the surface of the scanning target before the second light pattern begins to move in a same direction at an equal speed.