Device and system for testing camera in high and low temperature environments

A device for testing a camera in high and low temperature environments, comprising:

• a high and low temperature cabinet, a parallel light tube component, a test piece, a test box, a first positioning table, and a second positioning table, wherein a heating tube and a refrigerating tube of the high and low temperature cabinet are respectively connected to the test box, the test box is arranged on the first positioning table, the test piece is arranged in the parallel light tube component, the parallel light tube component is arranged on the second positioning table, and the parallel light tube component and the test box are arranged opposite to each other, wherein the first positioning table comprises:
• a platform, a first sliding component, a second sliding component, and a first rotating component, wherein the first sliding component is arranged on the platform, the second sliding component is arranged on the first sliding component, the first rotating component is arranged on the second sliding component, and the test box is arranged on the first rotating component.