Method and system for measurement of optical loss in wafer level testing via wavelength-route division

A system for measurement of optical loss in wafer level testing via wavelength route division, comprising:

• a light source unit connected with a first fiber port assembly to provide an input light;
• a first grating coupler unit connected with the first fiber port assembly to couple a respective fiber array;
• a splitter unit connected with the first grating coupler unit to divert the input light to a plurality of routes;
• a combiner module connected with the plurality of routes to combine the light, wherein the routes between the splitter unit and the combiner module are of different lengths;
• a second grating coupler unit connected with the combiner module to couple an output fiber array;
• and
• an optical power detector module connected with a second fiber port assembly to collect an output spectrum, wherein the optical power detector module calculates a detected power based in part on the different lengths of the routes.