Pellicle and method of manufacturing thereof
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsPei-Cheng Hsu, Hsin-Chang Lee, Huan-Ling Lee, Chin-Hsiang Lin
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsPei-Cheng Hsu, Hsin-Chang Lee, Huan-Ling Lee, Chin-Hsiang Lin
Estimating the term…
A pellicle for an EUV photo mask includes a membrane attached to a frame. The membrane includes nanotubes, Ru—O—X catalyst structures partially covering a surface of each nanotube, and a protection layer to cover the Ru—O—X catalyst structures and the surface of each nanotube. X is a metal element of Mo, Ti, Zr or Nb. The Ru—O—X catalyst structures include first nano-particles of a X-containing material formed on the surface of each nanotube, and second nano-particles of a Ru-containing material formed on the first nano-particles, thereby forming catalysts or catalyst bridges. The pellicle advantageously has high EUV light transmittance and improved endurance against attacking particles (such as hydrogen particles), thereby having prolonged lifetime.
A method of manufacturing a pellicle for an extreme ultraviolet (EUV) photo mask, comprising:
A method of manufacturing a pellicle for an extreme ultraviolet (EUV) photo mask, comprising:
A pellicle for an extreme ultraviolet (EUV) photo mask, comprising:
Dependencies are inferred from the claim text.