Detection of leakage currents in intelligent semiconductor switch
AssigneeInfineon Technologies AG
InventorsChristian Djelassi-Tscheck, Mario Tripolt
Life of this patent
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Abstract
In accordance with an embodiment, a method includes activating a semiconductor switch coupled between a supply node and an output node to apply an output voltage to an electrical load coupled to the output node, wherein a supply voltage is provided to the supply node; and performing a leakage current test, comprising: deactivating the semiconductor switch to isolate the electrical load from the supply node; after deactivating the semiconductor switch, checking whether a time that elapses until the output voltage falls below a first voltage level is less than a threshold value; and activating the semiconductor switch after the checking.
Claims20
A method comprising:
- activating a semiconductor switch coupled between a supply node and an output node to apply an output voltage to an electrical load coupled to the output node, wherein a supply voltage is provided to the supply node;
- and
- performing a leakage current test, comprising:
- deactivating the semiconductor switch to isolate the electrical load from the supply node;
- while the semiconductor switch is deactivated, checking whether a time that elapses from the deactivation of the semiconductor switch until the output voltage falls below a first voltage level is less than a threshold value;
- and
- activating the semiconductor switch after the checking.
A smart semiconductor switch comprising:
- a transistor connected between a supply node and an output node;
- and
- a control circuit configured to switch the transistor on and off, and configured to perform a leakage current test comprising:
- switching the transistor off;
- while the transistor is switched off, checking whether a time that elapses from the switching off of the transistor until an output voltage present at the output node falls below a first voltage level is less than a threshold value;
- and
- switching the transistor on after the checking.
A circuit comprising:
- a transistor connected between a supply node and an output node;
- a control circuit configured to switch the transistor on and off;
- and
- a controller coupled to the control circuit and configured to perform a leakage current test comprising:
- switching the transistor off using the control circuit;
- while the transistor is switched off, checking whether a time that elapses from the switching off of the transistor until an output voltage at the output node falls below a first voltage level is less than a threshold value;
- and
- switching the transistor on after the checking.
Dependencies are inferred from the claim text.