Optical measurement system
AssigneeSintela Limited
InventorStuart J. Russell
Life of this patent
Estimating the term…
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AssigneeSintela Limited
InventorStuart J. Russell
Estimating the term…
An optical measurement system in which a coherent light source generates a light signal, and a launch stage receives the light signal from the light source and generates a test signal. The test signal is launched along an optical path. The launch stage includes a first IQ modulator for controlling the test signal. The optical measurement system further includes a local oscillator stage configured to generate a local oscillator signal, wherein local oscillator stage has a second IQ modulator for controlling the local oscillator signal. A detector stage of the system is configured to receive the local oscillator signal from the local oscillator stage and a scattered signal from the optical path, and interfere the local oscillator signal with the scattered signal. The optical measurement system is implemented with one or more photonic integrated circuits.
An optical measurement system comprising:
Dependencies are inferred from the claim text.