Image sensor including plural memory areas for storing bad pixel information and image sensor test device

A method performed by an image sensor test device, the method comprising:

• providing a driving voltage to an image sensor to be tested;
• transmitting a control signal to the image sensor;
• and
• transmitting, to the image sensor, a storage control signal instructing to store information of a bad pixel which is determined based on an output signal of the image sensor which corresponds to the control signal,
• wherein the storage control signal comprises a signal of instructing to store the information about the bad pixel in a memory area of a plurality of memory areas areas in the image sensor, and
• wherein the method further comprises:
• exchanging, by a probe card, an electrical signal with a plurality of pads of the image sensor;
• and
• receiving, by an interface board, an output signal of the probe card and transmitting, by the interface board, the control signal to the image sensor.

An image sensor comprising:

• a plurality of memory areas
• a pixel array configured to generate a pixel signal corresponding to an intensity of incident light;
• a read-out circuit configured to:
• read the pixel signal,
• convert the pixel signal into a digital signal, and
• generate an image signal;
• and
• a bad pixel correcting circuit configured to correct at least one bad pixel in the image signal based on information about the at least one bad pixel and to output a corrected image signal,
• wherein the information about the at least one bad pixel comprises information obtained by reconstructing a plurality of pieces of the information about the at least one bad pixel stored in the plurality of memory areas,
• wherein the plurality of memory areas is located in a non-volatile memory device, and
• wherein the plurality of memory areas comprises different memory areas of one memory device or memory areas of different memory devices.