Sample observation device and sample observation method

A sample observation device comprising:

• an irradiation optical system configured to irradiate a sample with planar light;
• a scanner configured to scan the sample in a direction orthogonal to an irradiation surface of the planar light;
• an image capturer configured to include a pixel region for image capturing observation light generated in the sample by irradiation of the planar light to output image data based on a capturing result of the observation light in the pixel region;
• a generator configured to generate two-dimensional image data at each position in a scanning direction of the sample on the basis of the image data;
• and
• a linear encoder that outputs a trigger signal each time the scanner moves only by a predetermined distance, wherein
• the image capturer includes an area image sensor that performs image capturing by a rolling shutter method in which a start of an exposure period of each of pixel columns in the pixel region is shifted by predetermined time,
• the image capturer controls the exposure period in the image capturing by the rolling shutter method, based on the trigger signal, and
• the generator sets one pixel column of the pixel columns as a reference pixel column, and combines a data portion corresponding to an exposure position of the reference pixel column among exposure positions of pixel columns of one frame and a data portion corresponding to an exposure position of the reference pixel column among exposure positions of pixel columns of other frames continuous to the one frame, thereby generating two-dimensional image data corresponding to an exposure position of the reference pixel column in the one frame.