Methods and apparatus to determine a frequency of a signal
AssigneeTexas Instruments Incorporated
InventorsRohit Chatterjee, Atul Ramakant Lele
Life of this patent
Estimating the term…
Loading patent…
AssigneeTexas Instruments Incorporated
InventorsRohit Chatterjee, Atul Ramakant Lele
Estimating the term…
An example apparatus includes: comparison circuitry configured to determine first and second frequencies from a plurality of clock count ranges and a clock count value, the plurality of clock count ranges each having a range of possible count values corresponding to possible frequencies, the first and second frequencies correspond to the clock count ranges that include the clock count value; comparator circuitry configured to generate a temperature indication based on a comparison of a temperature voltage to a reference temperature voltage; and overlap determination circuitry configured to select one of the first or second frequencies based on the comparator circuitry.
An apparatus comprising:
A device comprising:
A method comprising:
Dependencies are inferred from the claim text.