Image analysis apparatus, image analysis method, and program

An image analysis method comprising:

• a step of acquiring an infrared thermal image that is a captured image of a structure to be inspected;
• a step of acquiring a visible image that is a captured image of the structure to be inspected;
• a step of determining a temperature defect from the infrared thermal image;
• a step of determining a surface defect, corresponding to the temperature defect, from the visible image;
• a step of determining a temperature defect information, wherein the temperature defect information includes at least a temperature distribution of the temperature defect;
• a step of determining a surface defect information, wherein the surface defect information includes at least a luminance distribution of the surface defect;
• a step of determining a first similarity between the temperature distribution and the luminance distribution for a region corresponding to the entire temperature defect;
• a step of determining a second similarity between the temperature distribution and the luminance distribution for a region corresponding to a portion of the temperature defect;
• a step of determining that the surface defect corresponding to the temperature defect is a crack or peeling;
• and
• a step of estimating a cause of the temperature defect on the basis of the temperature defect information and the surface defect information, wherein the estimate of the cause of the temperature defect is determined to be bulging accompanied by the crack or peeling when no similarity is found in the first similarity determination but similarity is found in the second similarity determination.

A non-transitory, computer readable tangible recording medium which records thereon a program for causing, when read by a computer, the computer to execute:

• a step of acquiring an infrared thermal image that is a captured image of a structure to be inspected;
• a step of acquiring a visible image that is a captured image of the structure to be inspected;
• a step of determining a temperature defect from the infrared thermal image;
• a step of determining a surface defect, corresponding to the temperature defect, from the visible image;
• a step of determining a temperature defect information, wherein the temperature defect information includes at least a temperature distribution of the temperature defect;
• a step of determining a surface defect information, wherein the surface defect information includes at least a luminance distribution of the surface defect;
• a step of determining a first similarity between the temperature distribution and the luminance distribution for a region corresponding to the entire temperature defect;
• a step of determining a second similarity between the temperature distribution and the luminance distribution for a region corresponding to a portion of the temperature defect;
• a step of determining that the surface defect corresponding to the temperature defect is a crack or peeling;
• and
• a step of estimating a cause of the temperature defect on the basis of the temperature defect information and the surface defect information, wherein the estimate of the cause of the temperature defect is determined to be bulging accompanied by the crack or peeling when no similarity is found in the first similarity determination but similarity is found in the second similarity determination.