Smart mechanism to evaluate performance of test engineers
AssigneeDell Products L.P.
InventorsHuijuan Fan, Steven Wenguo Shen
Life of this patent
Estimating the term…
Loading patent…
AssigneeDell Products L.P.
InventorsHuijuan Fan, Steven Wenguo Shen
Estimating the term…
Methods, system, and non-transitory processor-readable storage medium for a resource evaluation system are provided herein. An example method includes obtaining defect data obtained in response to executing software on a plurality of tester systems. The resource evaluation system determines a performance weighted metric associated with a defect detection resource and the defect data. Using the performance weighted metric, the resource evaluation system determines a defect scope delta percentage associated with the defect detection resource and the defect data. The resource evaluation system then determines a defect detection resource score based on the defect scope delta percentage.
A method, comprising:
A system comprising:
A computer program product comprising a non-transitory processor-readable storage medium having stored therein program code of one or more software programs, wherein the program code when executed by at least one processing device causes said at least one processing device:
Dependencies are inferred from the claim text.