Measurement system

A measurement system, the measurement system comprising:

• a measurement instrument configured to receive a radio frequency (RF) signal from a device under test, the measurement instrument including at least one analog-to-digital converter (ADC) and a digital signal processing circuit;
• at least one adjustable attenuator that is provided upstream of the at least one ADC, wherein the at least one adjustable attenuator is configured to attenuate the RF signal,
• wherein the at least one ADC is configured to receive and digitize the RF signal, thereby obtaining a digitized RF signal, and
• wherein the digital signal processing circuit is configured to:
• receive and process the digitized RF signal;
• determine whether the at least one ADC is operated in an overload operating state based on the digitized RF signal;
• determine at least one time frame of the digitized RF signal in which the at least one ADC is operated in the overload operating state, and
• determine whether the at least one time frame corresponds to a critical portion of the RF signal or to an uncritical portion of the RF signal,
• wherein the critical portions of the RF signal are portions of the RF signal that are relevant for the integrity of data to be transmitted via the RF signal, and wherein uncritical portions of the RF signal are portions of the RF signal that are not relevant for the integrity of data to be transmitted via the RF signal, and
• wherein the signal processing circuit is further configured to control the at least one adjustable attenuator to attenuate the RF signal such that the at least one ADC is operated in a nominal operating state for critical portions of the RF signal.