US 12,601,776 B2 · Power-semiconductor-device test apparatus facilitating test-connection changes

Abstract

Power semiconductor-device test apparatuses carrying out gate-signal controlled on/off switching of high-amp test current for various forms of device lifespan testing. Fork plugs or like connectors are insertable through openings of choice in walls partitioning the test apparatus interior for connection, in lieu of altering of wire-line changes, to switch circuits of choice, facilitating test-type connection changing. Sample-connection circuits, removable by means of connectors, include gate-driver, variable-resistor, constant-current, and voltage-output circuits, and via the gate driver circuits generate gate signals, adjustable via the variable-resistor circuits, shorting-circuit on/off applied to the gate terminals of devices under test. The constant-current circuit feeds a diode across the non-gate terminals of a device under test. A control circuit varies current, gate, and output voltages to set the test conditions so that device-under-test temperature will be a predetermined value.

Claims30

Dependent claims

A semiconductor-device test apparatus for testing a semiconductor-device having a first connection, a second connection, and a gate connection, the semiconductor-device test apparatus equipped with:

a power-supply circuit having a third connection and a fourth connection, and for supplying either test current or test voltage;
a first switch-circuit board having a fifth connection and a sixth connection, and on which a first switch circuit is either disposed or formed;
a voltage output circuit for outputting a voltage across the first connection and the second connection of the semiconductor device under test;
and
a gate driver circuit for applying to the gate connection a periodic signal voltage;
wherein
said third connection and said sixth connection are connected;
said fifth connection is for connecting with the first connection;
and
said fourth connection is for connecting with the second connection.

7 more elements

A semiconductor-device test apparatus for testing a semiconductor device having a first connection, a second connection, and a gate connection, the semiconductor-device test apparatus equipped with:

a power-supply circuit having a third connection and a fourth connection, and for supplying either test current or test voltage;
a first switch-circuit board having a fifth connection and a sixth connection, and on which a first switch circuit is either disposed or formed;
a second switch-circuit board having a seventh connection and an eighth connection, and on which a second switch circuit is either disposed or formed;
a voltage output circuit for outputting a voltage across the first connection and the second connection of the semiconductor device under test;
and
a gate driver circuit for applying to the gate connection a periodic signal voltage;
wherein
said third connection and said sixth connection are connected;
said fifth connection is for connecting with the first connection;
said fourth connection is for connecting with the second connection;
said seventh connection and said third connection are connected;
and
said eighth connection and said fourth connection are connected.

10 more elements

A semiconductor-device test apparatus for testing a semiconductor device having a first connection, a second connection, a thirteenth connection, a first gate connection, and a second gate connection, equipped with:

a power-supply circuit having a third connection and a fourth connection, and for supplying either test current or test voltage;
a first switch-circuit board having a fifth connection and a sixth connection, and on which a first switch circuit is either disposed or formed;
a second switch-circuit board having a seventh connection and an eighth connection, and on which a second switch circuit is either disposed or formed;
a first gate driver circuit for applying a periodic first signal voltage to the first gate connection;
and
a second gate driver circuit for applying a periodic second signal voltage to the second gate connection;
wherein
said third connection and said sixth connection are connected;
said fifth connection is for connecting with the first connection;
said fourth connection is for connecting with the second connection;
said seventh connection and said third connection are connected;
and
said eighth connection and said fourth connection are connected.

10 more elements

A semiconductor-device test apparatus for testing a semiconductor device having a first connection, a second connection, and a gate connection, the semiconductor-device test apparatus equipped with:

a power-supply circuit having a third connection and a fourth connection, and for supplying either test current or test voltage;
a first switch-circuit board having a fifth connection and a sixth connection, and on which a first switch circuit is either disposed or formed;
a gate driver circuit for applying to the gate connection a periodic signal voltage;
and
a resistor circuit either formed or arranged on the gate connection of the semiconductor device under test and on the gate driver circuit;
wherein
said third connection and said sixth connection are connected;
said fifth connection is for connecting with the first connection;
said fourth connection is for connecting with the second connection;
and
voltage across the resistor-circuit terminals is measured.

8 more elements

Dependencies are inferred from the claim text.

Power-semiconductor-device test apparatus facilitating test-connection changes

Life of this patent

Power-semiconductor-device test apparatus facilitating test-connection changes

Life of this patent

Abstract

Claims30