Test terminal
AssigneeF Time Technology Industrial Co., Ltd.
InventorsChang-Lin Peng, Chih-Min Peng, Yu-Han Huang
Life of this patent
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AssigneeF Time Technology Industrial Co., Ltd.
InventorsChang-Lin Peng, Chih-Min Peng, Yu-Han Huang
Estimating the term…
A test terminal has a connecting assembly and at least one probe assembly. The connecting assembly has a first connecting unit and a second connecting unit. The first connecting unit has an installation hole and the second connecting unit has a limit space. The probe assembly includes a main sleeve, a connecting sleeve, a probe module, and a buffering module. The main sleeve is mounted through the installation hole and the limit space. The main sleeve has a channel and an abutting part mounted on an outer annular surface. The connecting sleeve is sleeved on the main sleeve and mounted through the installation hole. The probe module is mounted in the channel. The buffering module is mounted on the main sleeve and abuts the second connecting unit. The connecting sleeve and the buffering module together clamp the second connecting unit, facilitating ease in installing and removing the probe assembly.
A test terminal comprising:
Dependencies are inferred from the claim text.