Vertical probe card and open-type probe thereof

A vertical probe card, comprising:

• a first guide plate unit;
• a second guide plate unit corresponding in position to and spaced apart from the first guide plate unit along a thickness direction;
• a plurality of conductive probes assembled to the first guide plate unit and the second guide plate unit, wherein each of the conductive probes includes:
• a transmission segment having two end portions respectively arranged in the first guide plate unit and the second guide plate unit;
• a testing segment that extends from one of the two end portions of the transmission segment to protrude out of the first guide plate unit;
• and
• a transferring segment that extends from another one of the two end portions of the transmission segment to protrude out of the second guide plate unit;
• and
• a plurality of open-type probes assembled to the first guide plate unit, wherein each of the open-type probes includes:
• a frame coupled through and fixed in the first guide plate unit, wherein the frame has an operation slot and two lateral openings that are in spatial communication with the operation slot, and an end opening of the operation slot is arranged away from the second guide plate unit, and wherein the frame has an end wall and two lateral arms that are connected to the end wall, and ends of the two lateral arms arranged away from the end wall jointly define the end opening of the operation slot;
• an elastic member assembled in the frame and arranged in the operation slot;
• and
• a pin having an inner segment assembled in the operation slot and a contacting segment that is connected to the inner segment, wherein the inner segment has:
• a limiting rod inserted into the elastic member;
• and
• a slider connected to the limiting rod and the contacting segment, wherein the slider is sandwiched between the two lateral arms, one end of the slider abuts against the elastic member, and another end of the slider abuts against the ends of the two lateral arms;
• wherein the elastic member is compressed by the frame and the inner segment so as to establish an electrical connection between the frame and the pin, and the contacting segment protrudes from the end opening and the first guide plate unit, and wherein the elastic member and the inner segment of the pin are located between the two lateral openings;
• wherein, in each of the open-type probes, the contacting segment of the pin is configured to abut against a device under test (DUT), so that the contacting segment is moved toward the operation slot, and the inner segment presses the elastic member, such that the elastic member is deformed to generate an elastic force.