Calibration jig, mammography apparatus, and program
AssigneeFUJIFILM Corporation
InventorsShinichiro Konno, Takashi Tajima
Life of this patent
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Abstract
A calibration jig is attached to a biopsy apparatus used in combination with a mammography apparatus, and that is for performing calibration to match three-dimensional coordinate systems of the mammography apparatus and the biopsy apparatus, and the calibration jig includes a pseudo biopsy needle that is a pseudo needle of a biopsy needle that is actually used in the biopsy apparatus; and a marker that has a plurality of parts each of which a positional relationship with a needle tip of the pseudo biopsy needle is known.
Claims17
A calibration jig that is attached to a biopsy apparatus used in combination with a mammography apparatus, and that is for performing calibration to match three-dimensional coordinate systems of the mammography apparatus and the biopsy apparatus, the calibration jig comprising:
- a pseudo biopsy needle that is a pseudo needle of a biopsy needle that is actually used in the biopsy apparatus;
- and
- a marker that has a plurality of parts each of which a positional relationship with a needle tip of the pseudo biopsy needle is known.
Dependencies are inferred from the claim text.