System and method for determining refraction features of both first and second eyes of a subject

A system for determining refraction features of both first and second eyes of a subject, the system comprising:

• a light field display device having a reference frame in three-dimensions;
• a system of localisation of 3D positions of the first and second eyes of the subject viewing said light field display device, relatively to the reference frame;
• and
• control circuitry configured to control the light field display device,
• wherein the control circuitry and the light field display device are configured to use the 3D position of the first eye relatively to the reference frame to generate a first light field directed selectively toward the first eye of the subject, said first light field being adapted to form a first image on the first eye of the subject,
• wherein the control circuitry is further configured to adjust said first light field as a function of at least a first refraction parameter associated with at least a first optical aberration for said first eye so that said first image is perceived corrected for a first adjusted value of said first refraction parameter by the first eye,
• wherein the control circuitry is further configured to determine a refraction feature of the first eye from the first adjusted value of said first refraction parameter,
• wherein the control circuitry and the light field display device are configured to use the 3D position of the second eye relatively to the reference frame to generate a second light field directed selectively toward the second eye of the subject, said second light field being adapted to form a second image on said second eye of the subject,
• wherein the control circuitry is further configured to adjust said second light field as a function of at least a second refraction parameter associated with at least a second optical aberration for the second eye so that the second image is perceived corrected for a second adjusted value of said second refraction parameter by the second eye, and
• wherein the control circuitry is further configured to determine a refraction feature of the second eye from the second adjusted value of said second refraction parameter.