Reference sample suitable to calibrate magnetic microscope's probe tip and calibration method

A reference sample suitable to calibrate a magnetic microscope's probe tip, and having a substrate material and a magnetic micro-nanostructure made from a magnetic material capable of producing a magnetic field with a specific spatial distribution on a surface of the reference sample, wherein

• the substrate material of the reference sample is a semiconductor single crystalline material;
• the magnetic material is a magnetic film having properties of vertical magnetic anisotropy;
• the magnetic micro-nanostructure is configured to be at least one group of magnetic micro-nano structures, and each group of magnetic micro-nano structures includes at least one group of substructures, the substructures are configured to be a plurality in predetermined size and shape, the substructures are separated by a certain distance from each other, and in a single magnetic domain, a magnetization direction of which is perpendicular to the surface of the reference sample is formed within each of the substructures;
• widths of the substructures vary from 100 nm to 10 nm, and starting and ending spatial frequencies corresponding to the substructures vary from 1/200 nm−1 to 1/20 μm−1.