Inspection device and inspection method with infrared light for scratch detection on inspection target

An inspection device comprising:

• an infrared acquisition unit configured to acquire an intensity of infrared light detected by an infrared camera configured to detect the infrared light from an inspection target including a conductive member;
• an intensity determination unit configured to determine a detection intensity of the infrared light;
• and
• a scratch determination unit configured to determine a presence or an absence of a scratch on the conductive member based on the detection intensity of the infrared light;
• wherein:
• a wavelength of the infrared light is a wavelength that passes through the inspection target and a top coat on the inspection target, but does not pass through the conductive member;
• and
• the infrared acquisition unit is configured to change a detection sensitivity of the infrared camera according to a distance between the inspection target and the infrared camera.