Measurement system with detection mechanism and method of operation thereof
AssigneePark Systems Corp.
InventorsHanaul Noh, Chih-Chieh Hsieh, Myunghoon Choi, Stefan Kaemmer
Life of this patent
Estimating the term…
Abstract
A method of operation of a measurement system includes: capturing a probe measurement associated with a key, where the probe measurement is a first response or a second response based on a first microwave excitation or a second microwave excitation, respectively; generating a first channel voltage or a second channel voltage based on the first response or the second response, respectively; determining a phase offset based on the first channel voltage; storing the phase offset associated with the key; and calibrating the probe measurement by adjusting a phase based on computation of the second channel voltage with the phase offset accessed by the key.
Claims20
A measurement system comprising:
- an impedance detection unit configured to:
- capture a probe measurement associated with a key, where the probe measurement is a first response or a second response based on a first microwave excitation or a second microwave excitation, respectively;
- generate a first channel voltage or a second channel voltage based on the first response or the second response, respectively;
- determine a phase offset based on the first channel voltage;
- store the phase offset associated with the key;
- and
- calibrate the probe measurement by adjusting a phase based on computation of the second channel voltage with the phase offset accessed by the key.
A method of operation of a measurement system comprising:
- capturing a probe measurement associated with a key, where the probe measurement is a first response or a second response based on a first microwave excitation or a second microwave excitation, respectively;
- generating a first channel voltage or a second channel voltage based on the first response or the second response, respectively;
- determining a phase offset based on the first channel voltage;
- storing the phase offset associated with the key;
- and
- calibrating the probe measurement by adjusting a phase based on computation of the second channel voltage with the phase offset accessed by the key.
A non-transitory computer-readable medium storing an instruction that, when executed by a control circuit of a measurement system, causes the control circuit to perform functions comprising:
- capturing a probe measurement associated with a key, where the probe measurement is a first response or a second response based on a first microwave excitation or a second microwave excitation, respectively;
- generating a first channel voltage or a second channel voltage based on the first response or the second response, respectively;
- determining a phase offset based on the first channel voltage;
- storing the phase offset associated with the key;
- and
- calibrating the probe measurement by adjusting a phase based on computation of the second channel voltage with the phase offset accessed by the key.
Dependencies are inferred from the claim text.