Non-contact systems and methods for determining distance between silicon melt and reflector in a crystal puller
AssigneeGlobalWafers Co., Ltd.
InventorRichard Joseph Phillips
Life of this patent
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AssigneeGlobalWafers Co., Ltd.
InventorRichard Joseph Phillips
Estimating the term…
A measurement system includes a target object at least partially visible through an opening in a crystal puller. The crystal puller has a silicon melt in a crucible and a reflector defining a central passage through which a crystal is pulled. A detector array captures light through the opening. The detector array is directed to a surface of the silicon melt in the crystal puller and to the target object, and a laser selectively transmits a coherent light beam through the opening to the target object to produce a reflection of the target object on the surface of the silicon melt. An optical modulator pulses the coherent light beams of the laser into discrete coherent light beams having a period, and a lock-in amplifier is connected to the detector array to filter discrete coherent light having the period from captured light.
A crystal puller having at least one heater, a silicon melt in a crucible and a measurement system for determining a distance between the silicon melt and a reflector while a crystal is being pulled from the silicon melt, the system comprising:
A measurement system comprising:
A method of determining a distance between a silicon melt in a crucible and a reflector in a crystal puller while a crystal is being pulled from the silicon melt using a measurement system:
Dependencies are inferred from the claim text.