Semiconductor integrated circuit and semiconductor device
AssigneeMitsubishi Electric Corporation
InventorOsamu Nishikido
Life of this patent
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Abstract
In a semiconductor integrated circuit, a first analog circuit block operates by a voltage applied between a first node and a third node. Each of a plurality of first current sources has a first end connected to the third node and a second end connected to the first analog circuit block. The plurality of first current sources function as current sourcing or current sinking for the first analog circuit block. A first switch group is provided between the plurality of first current sources and the first analog circuit block, and in a test mode, individually switches electrical connection of the second end of each of the plurality of first current sources from the first analog circuit block to a second node.
Claims15
A semiconductor integrated circuit comprising:
- a first node;
- a second node;
- a third node;
- a first analog circuit block to operate by a voltage applied between the first node and the third node;
- a plurality of first current sources each having a first end connected to the third node and a second end connected to the first analog circuit block, to function as current sourcing or current sinking for the first analog circuit block;
- and
- a first switch group to be provided between the plurality of first current sources and the first analog circuit block, and in a test mode, to individually switch electrical connection of the second end of each of the plurality of first current sources from the first analog circuit block to the second node such that an electric current generated by each first current source flows through the second node instead of through the first analog circuit block.
A semiconductor device comprising:
- a semiconductor integrated circuit including:
- a first node;
- a second node;
- a third node;
- a first analog circuit block to operate by a voltage applied between the first node and the third node;
- a plurality of first current sources each having a first end connected to the third node and a second end connected to the first analog circuit block, to function as current sourcing or current sinking for the first analog circuit block;
- and
- a first switch group to be provided between the plurality of first current sources and the first analog circuit block, and in a test mode, to individually switch electrical connection of the second end of each of the plurality of first current sources from the first analog circuit block to the second node such that an electric current generated by each first current source flows through the second node instead of through the first analog circuit block;
- and
- a current measurement circuit connected to the second node, wherein
- the current measurement circuit includes:
- a current-voltage conversion circuit connected to the second node to convert current flowing out from the second node or flowing into the second node into a voltage;
- an analog-to-digital converter to convert a conversion voltage generated by the conversion of the current-voltage conversion circuit into a digital value;
- and
- a comparator to compare the digital conversion voltage output from the analog-to-digital converter with a reference value.
Dependencies are inferred from the claim text.