Measurement device and board inspection device
AssigneeYamaha Hatsudoki Kabushiki Kaisha
InventorsTakahiro Matsukubo, Takeshi Arai
Life of this patent
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Abstract
A measurement device includes an imager, a first projector to project a linear first measurement light beam onto a measurement target from a direction inclined at a first angle, and a second projector to project a linear second measurement light beam onto the measurement target from a direction inclined at a second angle. The measurement device further includes a controller configured or programmed to remove reflected light noise based on the first measurement light beam and the second measurement light beam projected onto the measurement target and imaged by the imager and acquire height information of the measurement target.
Claims17
A measurement device comprising:
- an imager to image a measurement target;
- a first projector on a first side with respect to the imager to project a linear first measurement light beam onto the measurement target from a direction inclined at a first angle with respect to a horizontal direction;
- a second projector on the first side with respect to the imager to project a linear second measurement light beam onto the measurement target from a direction inclined at a second angle different from the first angle with respect to the horizontal direction;
- and
- a controller configured or programmed to remove reflected light noise based on the first measurement light beam and the second measurement light beam projected onto the measurement target and imaged by the imager and acquire height information of the measurement target.
A board inspection device comprising:
- a board holder to hold a board on which an electronic component has been mounted;
- and
- a measurement unit to measure the board held by the board holder;
- wherein
- the measurement unit includes:
- an imager to image the board;
- a first projector on a first side with respect to the imager to project a linear first measurement light beam onto the board from a direction inclined at a first angle with respect to a horizontal direction;
- a second projector on the first side with respect to the imager to project a linear second measurement light beam onto the board from a direction inclined at a second angle different from the first angle with respect to the horizontal direction;
- and
- a controller configured or programmed to remove reflected light noise based on the first measurement light beam and the second measurement light beam projected onto the board and imaged by the imager and acquire height information of the board.
Dependencies are inferred from the claim text.