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US 12,416,494 B2Granted
Method for calibrating a THz measuring device and extrusion and measurement system
AssigneeCiTEX Holding GmbH
InventorAndrej Unruh
Life of this patent
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Abstract
The present disclosure relates to a method for calibrating a stationary THz measuring device which measures geometric properties of a profile by means of one or more THz sensors during an extrusion of the profile, comprising at least one or more steps.
Claims17
A method for calibrating a stationary THz measuring device which measures geometric properties of a profile during an extrusion of the profile by means of one or more THz sensors, the method comprising at least the following steps:
- after extrusion of the profile step of stationary inline THz measurement step by outputting first THz radiation from one or more THz sensors of the stationary THz measuring device onto the profile, detecting the first THz radiation reflected at interfaces of the profile and outputting a first measurement signal of the stationary THz measuring device,
- reference measurement of a wall thickness at a measuring point of a profile piece by means of a reference measuring device on the basis of a reference measuring method alternative to THz measurement, with generation of a second measuring signal,
- measurement of the profile piece at the measuring point by means of a portable THz measuring device with generation of a mobile third measuring signal,
- calibration of the mobile third measurement signal on the basis of the second measurement signal, with determination of a refractive index of the profile piece, and
- calibration of the first measurement signal of the stationary THz measurement device on the basis of the determined refractive index of the profile piece.
2 more elements
An extrusion and measuring system for producing and measuring profile pieces, comprising:
- an extrusion line comprising an extruder adapted to extrude profiles,
- a stationary THz measuring device arranged downstream of the extruder for measuring an extruded profile, the THz measuring device comprising one or more THz sensors aligned with an axis of symmetry of the extrusion line, for measuring geometric properties of the extruded profile, a take-off for taking off the extruded profile, a separating device for separating profile pieces from the profile,
- a reference measuring device which is set up to measure a reference wall thickness of a separated profile piece using a measuring method which is alternative to THz measuring a portable THz measuring device with a support contour, for placing on a separated profile piece and for measuring it, the portable THz measuring device being programmable and being designed to record a value of a determined wall thickness for calibration purposes, and a control and evaluation device which is set up and designed to record a determined refractive index via an interface and to determine geometric properties of the profile piece from at least the first measurement signal of the stationary THz measuring device on the basis of the determined refractive index.
Dependencies are inferred from the claim text.