Signal generator and memory

A memory, configured for generating a test signal having a duty cycle satisfying a preset condition based on a signal generator, the signal generator comprising:

• an oscillation generation circuit, configured to generate an initial oscillation signal based on an oscillation control signal, wherein the oscillation control signal is used for adjusting a frequency of the generated initial oscillation signal;
• a duty cycle correction circuit, connected to an output end of the oscillation generation circuit and configured to adjust a duty cycle of the initial oscillation signal based on a duty cycle control signal, to generate an adjusted oscillation signal;
• an output interface, connected to an output end of the duty cycle correction circuit and configured to output the adjusted oscillation signal to an external test system, wherein the external test system is configured to test whether the adjusted oscillation signal satisfies a preset condition;
• and
• an amplitude adjustment circuit, connected to the output end of the duty cycle correction circuit and configured to adjust an amplitude of the adjusted oscillation signal based on an amplitude control signal, to generate a test signal;
• wherein the duty cycle on circuit comprises;
• a first adjustment circuit, connected to the oscillation circuit and configured to increase the duty cycle of the initial oscillation signal generate a first adjustment signal;
• a second adjustment circuit, connected to the oscillation generation circuit and configured to reduce the duty cycle of the initial oscillation signal to generate a second adjustment signal;
• and
• a correction circuit, connected to the first adjustment circuit and the second adjustment circuit and configured to generate the adjusted oscillation signal according to the duty cycle control signal, the first adjustment signal and the second adjustment signal, wherein the duty cycle control signal is used for adjusting signal proportion of the first adjustment signal and signal proportion of the second adjustment signal in the generated adjusted oscillation signal.