Mass spectrometer and mass spectrometry method
AssigneeHitachi High-Tech Corporation
InventorsTakuma Nishimoto, Zihao Ong, Isao Furuya, Hiroshi Touda, Yuichiro Hashimoto, Masuyuki Sugiyama
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi High-Tech Corporation
InventorsTakuma Nishimoto, Zihao Ong, Isao Furuya, Hiroshi Touda, Yuichiro Hashimoto, Masuyuki Sugiyama
Estimating the term…
In a mass spectrometer, due to impurities accumulated inside a frame, a withstand voltage may decrease, and electric discharge may occur in an ion source, thereby making it impossible to perform normal measurement. Since a result of abnormality measurement due to the electric discharge cannot be distinguished from measurement abnormality caused by clogging of a tube between a pretreatment unit and a needle, there is a problem in that time is required to identify abnormal portions, and a maintenance property is lowered. As a unit for solving the problem, a return current detection unit connected in series between the frame and an ion source power supply that applies a voltage to the needle and a return current detection unit connected in series between the frame and a counter electrode power supply that applies a voltage to a counter electrode are provided.
A mass spectrometer for analyzing a sample, the mass spectrometer comprising:
A mass spectrometry method for analyzing a sample using a mass spectrometry, the mass spectrometry including
Dependencies are inferred from the claim text.