Generation method, estimation method, generator, and estimator
AssigneePanasonic Intellectual Property Management Co., Ltd.
InventorsHiroko Yoshida, Nobuo Hara, Koichi Wakitani, Akihisa Nakahashi
Life of this patent
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AssigneePanasonic Intellectual Property Management Co., Ltd.
InventorsHiroko Yoshida, Nobuo Hara, Koichi Wakitani, Akihisa Nakahashi
Estimating the term…
An experiment of processing a device is performed to acquire type 1 information and type 2 information indicating processing conditions, and type 3 information and type 4 information indicating results of the processing, derive a first relation between the type 1 information, the type 2 information, and the type 3 information, and a second relation between the type 1 information, the type 2 information, and the type 4 information, and generate and output a model that estimates the type 4 information indicating a result of the processing by using the first relation and the second relation with the type 2 information and the type 3 information that are measured during the processing as inputs.
A generation method that is executed by a processor executing instructions stored in a memory, the method comprising:
A generator comprising:
Dependencies are inferred from the claim text.