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US 12,223,170 B1Granted
Storage array latency analysis
AssigneeDell Products L.P.
InventorsDavid Moloney, Eileen Kelleher, Colm O'Leary
Life of this patent
Estimating the term…
Abstract
One or more aspects of the present disclosure relate to relate to analyzing and mitigation storage array latency. In embodiments, an input/output (IO) workload is received by a storage array. Additionally, a latency corresponding to processing one or more IO requests of the IO workload is determined. For example, a factor corresponding to a significant portion of the latency is identified. Further, a remediation action is performed based on the factor identified.
Claims16
A method comprising:
- receiving an input/output (IO) workload at a storage array;
- determining a latency corresponding to processing one or more IO requests of the IO workload;
- identifying a cause of a portion of the latency;
- determining an external factor contributing to a first portion of the latency, wherein the external factor includes an external transfer time corresponding to the one or more IO requests;
- and
- performing a remediation action based on the cause identified.
3 more elements
An apparatus including a memory and processor, the apparatus configured to:
- receive an input/output (IO) workload at a storage array;
- determine a latency corresponding to processing one or more IO requests of the IO workload;
- identify a cause of a portion of the latency;
- determine an external factor contributing to a first portion of the latency, wherein the external factor includes an external transfer time corresponding to the one or more IO requests;
- and
- perform a remediation action based on the cause identified.
3 more elements
Dependencies are inferred from the claim text.