Current load circuit and chip for testing power supply circuit

A current load circuit for testing a power supply circuit, comprising:

• a first load generation circuit, having a plurality of first load configurations and configured to, when being activated, alternately provide one of the plurality of first load configurations according to a clock signal to receive a first portion of a supply current provided by the power supply circuit so as to output a first indication signal configured to indicate the performance of the power supply circuit accordingly;
• a second load generation circuit, having a plurality of second load configurations and configured to, when being activated, alternately provide one of the plurality of second load configurations according to the clock signal to receive a second portion of the supply current provided by the power supply circuit so as to output a second indication signal configured to indicate the performance of the power supply circuit accordingly;
• and
• a control circuit, configured to determine a time interval between the activation of the first load generation circuit and the second load generation circuit according to the clock signal.

A chip for testing a power supply circuit, comprising:

• a phase locked loop, coupled to the power supply circuit and configured to generate a clock signal;
• and
• a current load circuit, coupled to the power supply circuit, wherein the current load circuit comprises:
• a load generation circuit, configured to alternately provide one of a plurality of load configurations as a current load of the load generation circuit according to the clock signal and a reset signal, wherein the current load circuit outputs an indication signal configured to indicate a performance of the power supply circuit according to the current load and by receiving a supply current provided by the power supply circuit.