Method of generating device model and computing device performing the same
AssigneeSamsung Electronics Co., Ltd.
InventorsGwangnae Gil, Seyoung Park, Sola Woo, Jonghyun Lee
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AssigneeSamsung Electronics Co., Ltd.
InventorsGwangnae Gil, Seyoung Park, Sola Woo, Jonghyun Lee
Estimating the term…
Measurement data are produced by measuring characteristics of a semiconductor device. Target parameters are selected among a plurality of parameters of a device model where the device model is configured to perform a simulation based on device data and output simulation result data indicating the characteristics of the semiconductor device. Initial value sets corresponding to different combinations of initial values of the target parameters are selected. Local minimum values are determined based on reinforcement learning. Each local minimum value corresponds to a minimum value of a difference between the measurement data and the simulation result data with respect to each initial value set. Optimal values of the target parameters are determined based on the plurality of local minimum values. The device model capable of precisely predicting characteristics of the semiconductor device is generated by determining the parameters of the device model using the optimization scheme based on the reinforcement learning.
A method of generating a device model configured to perform a simulation based on device data and output simulation result data indicating characteristics of a semiconductor device, the method being performed by at least one processor executing program codes, the method comprising:
A method of generating a device model configured to perform a simulation based on device data and output simulation result data indicating characteristics of a semiconductor device, the method being performed by at least one processor executing program codes, the method comprising:
A computing device comprising:
Dependencies are inferred from the claim text.