Measuring instrument and measuring method
AssigneeTokyo Electron Limited
InventorsTakayuki Hatanaka, Kimihiro Yokoyama
Life of this patent
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AssigneeTokyo Electron Limited
InventorsTakayuki Hatanaka, Kimihiro Yokoyama
Estimating the term…
A measuring instrument according to an exemplary embodiment includes a base board, at least one sensor chip provided on the base board, and a circuit board provided on the base board. The at least one sensor chip includes a sensor unit including a signal electrode having a front surface intersecting the base board in a radial direction, a guard electrode disposed on a rear side of the signal electrode, and a first ground electrode disposed on a rear side of the guard electrode. The at least one sensor chip includes a second ground electrode extending along a lower surface of the sensor unit. A space between the second ground electrode and the sensor unit is filled with an insulating material.
A measuring instrument comprising:
A method of measuring an electrostatic capacitance by using a measuring instrument in a chamber of a processing system,
Dependencies are inferred from the claim text.