Apparatus for inspecting a tube and method of inspecting a tube using the apparatus
AssigneeSamsung Electronics Co., Ltd.
InventorWongoo Choi
Life of this patent
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AssigneeSamsung Electronics Co., Ltd.
InventorWongoo Choi
Estimating the term…
An apparatus for inspecting a tube may include a first probe holder, a second probe holder, and an eddy current sensor. The first probe holder may be configured to hold a first portion of the tube. The second probe holder may be rotatably connected to the first probe holder with respect to an axial direction of the tube, the second probe holder configured to hold a second portion of the tube. The eddy current sensor may be on any one of the first probe holder and the second probe holder, the eddy current sensor configured to inspect at least one welding portion of the tube using at least one eddy current. Thus, the eddy current sensor may accurately inspect the welding portion of the small tube held by the first probe holder and the second probe holder.
An apparatus for inspecting a tube, the apparatus comprising:
An apparatus for inspecting a tube, the apparatus comprising:
A method of inspecting a tube, the method comprising:
Dependencies are inferred from the claim text.