X-ray inspection apparatus
AssigneeIshida Co., Ltd.
InventorsKen Iwakawa, Akihiro Maenaka, Futoshi Yurugi
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AssigneeIshida Co., Ltd.
InventorsKen Iwakawa, Akihiro Maenaka, Futoshi Yurugi
Estimating the term…
An X-ray inspection apparatus includes an X-ray source configured to irradiate an article with X-rays in a plurality of energy bands, an X-ray detection unit capable of detecting the X-rays by a photon counting method, an image generation unit configured to generate an overall transmission image corresponding to the X-rays in all of the plurality of energy bands and a transmission image corresponding to the X-rays in some of the plurality of energy bands on the basis of a detection result of the X-rays by the X-ray detection unit, and an inspection unit configured to inspect the article on the basis of the overall transmission image and the transmission image.
An X-ray inspection apparatus comprising:
An X-ray inspection apparatus comprising:
Dependencies are inferred from the claim text.