Optical receiver photodiode testing using test optical terminal at different location than operational optical terminal
AssigneeGlobalFoundries U.S. Inc.
InventorsHanyi Ding, Aidong Yan, Rongtao Cao
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AssigneeGlobalFoundries U.S. Inc.
InventorsHanyi Ding, Aidong Yan, Rongtao Cao
Estimating the term…
A structure for testing a photodiode in a PIC using a grating coupler in optical communication with an optical terminal in a different location of the photodiode from another optical terminal used during operation of the PIC. The photodiode includes an operational optical terminal and a test optical terminal with the test optical terminal in a different location than the operational optical terminal. An optical component is in optical communication with the operational optical terminal of the photodiode and is used during operation of the photodiode and the PIC. A grating coupler is in optical communication with the test optical terminal of the photodiode for testing purposes.
A structure, comprising:
A designed-for-test (DFT) structure for a photonic integrated circuit (PIC), the DFT structure comprising:
A method, comprising:
Dependencies are inferred from the claim text.