Radio frequency source for inductively coupled and capacitively coupled plasmas in substrate processing chambers
AssigneeApplied Materials, Inc.
InventorsAbdul Aziz Khaja, Juan Carlos Rocha-Alvarez
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AssigneeApplied Materials, Inc.
InventorsAbdul Aziz Khaja, Juan Carlos Rocha-Alvarez
Estimating the term…
A radio frequency (RF) source may be used to generate a capacitively coupled plasma to perform a plasma-based process on a substrate in a plasma processing chamber. A controller may cause the RF source and a switching element to route an RF signal to electrodes in the pedestal that generate the plasma in the processing chamber as part of a recipe performed on a substrate during etch or deposition processes. Between processes, the controller may cause the same RF source to generate a second RF signal that is instead routed by the switching element to inductive coils to generate an inductively coupled plasma for a cleaning process to remove film deposits on the interior of the plasma processing chamber.
A system comprising:
A method of using a single Radio-Frequency (RF) source to generate inductively coupled plasmas and capacitively coupled plasmas in plasma processing chambers, the method comprising:
One or more non-transitory computer-readable media comprising instructions that, when executed by one or more processors, cause the one or more processors to perform operations comprising:
Dependencies are inferred from the claim text.