Determine optimized read voltage via identification of distribution shape of signal and noise characteristics

A method, comprising:

• measuring signal and noise characteristics of the memory cells;
• processing, by a logic circuit coupled to the memory cells, the signal and noise characteristics measured for the memory cells to obtain data representative of a count difference curve over a plurality of voltages;
• and
• determining, from the data, whether there is a change in concavity of two portions of the count difference curve over the plurality of voltages;
• wherein identification of a shape is based on concavity of the two portions of the count difference curve over the plurality of voltages.

A memory sub-system, comprising:

• a processing device;
• and
• at least one memory device, the memory device having a plurality of groups of memory cells;
• wherein in response to a command, the memory sub-system is configured to:
• measure signal and noise characteristics of a group of memory cells over a plurality of voltages;
• process the signal and noise characteristics measured for the group of memory cells to obtain data representative of a count difference curve over the plurality of voltages;
• determine, from the data, whether there is a change in concavity of two portions of the count difference curve over the plurality of voltages;
• select, based on whether there is a change in concavity of two portions of the count difference curve over the plurality of voltages, an operation to determine a voltage to read the group of memory cells;
• and
• determine a type of a shape based on concavity of the two portions of the count difference curve over the plurality of voltages.