Apparatus, system and method to detect and improve an input clock performance of a memory device

A method to be performed at an integrated circuit of a memory subsystem, the method including:

• performing one or more training iterations to tune a target clock signal frequency to be applied at a memory device, each of the one or more training iterations including:
• causing a modified clock signal frequency to be applied at the memory device;
• and
• decoding a quality feedback message from the memory device including an indication of a performance of the clock signal frequency at the memory device;
• and
• in response to a determination that the performance of the clock signal frequency falls within a target performance range of the memory device and that the clock signal frequency is below the target clock signal frequency, performing a subsequent training iteration of the one or more training iterations, and otherwise causing application at the memory device, during a memory operation, of a highest clock signal frequency corresponding to a training iteration for which performance of the clock signal was within the target performance range.

A non-transitory machine-readable storage medium having instructions stored thereon, the instructions, when executed by an integrated circuit of a memory subsystem, to cause the integrated circuit to perform operations including:

• performing one or more training iterations to tune a target clock signal frequency to be applied at a memory device, each of the one or more training iterations including:
• causing a modified clock signal frequency to be applied at the memory device;
• and
• decoding a quality feedback message from the memory device including an indication of a performance of the clock signal frequency at the memory device;
• and
• in response to a determination that the performance of the clock signal frequency falls within a target performance range of the memory device and that the clock signal frequency is below the target clock signal frequency, performing a subsequent training iteration of the one or more training iterations, and otherwise causing application at the memory device, during a memory operation, of a highest clock signal frequency corresponding to a training iteration for which performance of the clock signal was within the target performance range.