Defect inspection system having human-machine interaction function
AssigneesKapito Inc., Feng-Tso Sun, Yi-Ting Yeh, Feng-Yu Sun
InventorsFeng-Tso Sun, Yi-Ting Yeh, Feng-Yu Sun, Jyun-Tang Huang, Po-Han Chou
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AssigneesKapito Inc., Feng-Tso Sun, Yi-Ting Yeh, Feng-Yu Sun
InventorsFeng-Tso Sun, Yi-Ting Yeh, Feng-Yu Sun, Jyun-Tang Huang, Po-Han Chou
Estimating the term…
A defect inspection system is disclosed, and comprises a linear light source, N number of cameras, a display device, a tag reader, and a modular electronic device, in which the linear light source, the cameras and the modular electronic device are used for conducting a defect inspection of an article. On the other hand, the display device, the tag reader and the modular electronic device are adopted for conducting in production of at least one labeled example. Therefore, the modular electronic device is allowed to apply a machine learning process to an image classifier under using a training dataset containing the labeled examples, thereby producing at least one new defect recognition model or updating the existing defect recognition model.
A defect inspection system, comprising:
Dependencies are inferred from the claim text.