Position analysis device and method, and camera system
AssigneePanasonic Intellectual Property Management Co., Ltd.
InventorsDaijiroh Ichimura, Hidehiko Shin
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AssigneePanasonic Intellectual Property Management Co., Ltd.
InventorsDaijiroh Ichimura, Hidehiko Shin
Estimating the term…
A position analysis device includes: an input interface that acquires the captured image obtained by the camera; a processor that calculates coordinate transformation from a first coordinate system to a second coordinate system with respect to the target position in the acquired captured image; and a memory that stores a correction model to generate a correction amount of a position in the second coordinate system, wherein the processor corrects a transformed position from the target position, based on the correction model including weight functions corresponding to reference positions, the transformed position being a position obtained by the coordinate transformation on the target position in the first coordinate system to the second coordinate system, the weight functions each producing a larger weighting in the correction amount as the transformed position is closer to a corresponding reference position, the reference positions being different from each other in the second coordinate system.
A position analysis device for measuring a target position in a subject based on a captured image of the subject by a camera, the position analysis device comprising:
A position analysis method for measuring a target position in a subject based on a captured image of the subject by a camera, the position analysis method comprising:
Dependencies are inferred from the claim text.