Dark-field confocal microscopic measurement apparatus and method based on vortex dichroism
AssigneeHarbin Institute of Technology
InventorsJian Liu, Chenguang Liu, Zijie Hua
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AssigneeHarbin Institute of Technology
InventorsJian Liu, Chenguang Liu, Zijie Hua
Estimating the term…
Disclosed are a dark-field confocal microscopic measurement apparatus and method based on vortex dichroism. The apparatus includes an array vortex light generation module, an array vortex light illumination module and an array dark-field confocal detection module; an array vortex wave plate of the array vortex light generation module generates vortex light to illuminate a sample of the array vortex light illumination module; and the array dark-field confocal detection module extracts scattering signals, and identifies differences between scattering signals collected under the illumination of opposite-order vortex light. Three-dimensional distribution information of defects, such as subsurface scratches, abrasion, subsurface cracks, and bubbles, can be extracted by directly analyzing the scattering signals under the 1-order vortex illumination; and chirality information of the micro-nano material can be obtained by analyzing difference values of the scattering signals under the illumination of the opposite-order vortex light.
An apparatus, comprising an array vortex light generation module, an array vortex light illumination module and an array dark-field confocal detection module;
Dependencies are inferred from the claim text.